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Magnetic relaxation measurements of exchange biased (Pt/Co) multilayers with perpendicular anisotropy

机译:交换偏置(pt / Co)多层膜的磁弛豫测量   具有垂直各向异性

摘要

Magnetic relaxation measurements were carried out by magneto-optical Kerreffect on exchange biased (Pt/Co)5/Pt/FeMn multilayers with perpendicularanisotropy. In these films the coercivity and the exchange bias field vary withPt spacer thickness, and have a maximum for 0.2 nm. Hysteresis loops do notreveal important differences between the reversal for ascending and descendingfields. Relaxation measurements were fitted using Fatuzzo's model, whichassumes that reversal occurs by domain nucleation and domain wall propagation.For 2 nm thick Pt spacer (no exchange bias) the reversal is dominated by domainwall propagation starting from a few nucleation centers. For 0.2 nm Pt spacer(maximum exchange bias) the reversal is strongly dominated by nucleation, andno differences between the behaviour of the ascending and descending branchescan be observed. For 0.4 nm Pt spacer (weaker exchange bias) the nucleationdensity becomes less important, and the measurements reveal a much strongerdensity of nucleation centers in the descending branch.
机译:通过磁光Kerreffect对具有垂直各向异性的交换偏置(Pt / Co)5 / Pt / FeMn多层膜进行磁弛豫测量。在这些薄膜中,矫顽力和交换偏置场随Pt间隔层厚度的变化而变化,最大值为0.2 nm。磁滞回线并没有揭示出上升场和下降场反转之间的重要差异。使用Fatuzzo模型拟合弛豫测量值,该模型假定反转是通过畴核和畴壁传播发生的。对于2 nm厚的Pt间隔基(无交换偏压),反转主要是从几个成核中心开始的畴壁传播。对于0.2 nm Pt间隔基(最大交换偏压),逆转主要受成核作用的影响,在上升和下降分支的行为之间没有观察到差异。对于0.4 nm的Pt间隔基(较弱的交换偏压),成核密度变得不那么重要,并且测量结果显示下降分支中成核中心的密度要大得多。

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